« What’s New in Wind River Test Management 3.3? | Main | Compressed Schedules Driving Shorter Testing & Defect Resolution Requirements »

June 17, 2010

TrackBack

TrackBack URL for this entry:
http://www.typepad.com/services/trackback/6a00d83451f5c369e20133f15aa69a970b

Listed below are links to weblogs that reference A Crisis of Complexity – Industry Report on Growing Challenges in Embedded Testing:

Comments

Feed You can follow this conversation by subscribing to the comment feed for this post.

The comments to this entry are closed.

Paul Henderson

  • As Wind River's VP of Product Marketing for Device Test, Paul is driving new solutions for the testing, diagnostics, monitoring and management of intelligent devices. Paul Henderson has been leading product and marketing organizations in high-technology companies for more than 20 years in disciplines such as software development, distributed computing, open source software, and device management.

    Subscribe to RSS feed.

Disclaimer

Blog powered by TypePad