By Paul Henderson
I spend a lot of time talking to device development and test groups and I continue to be surprised by a number of things. One is how little test automation is in place if you look across embedded device companies and industries.
But another surprise is how little companies are doing in the way of “negative” testing. By this I mean testing that tries to break the system, validate fault and exception handlers or otherwise force the device in to an unusual state or “edge condition”.